Mag X 125 High Resolution Inspection

The mag.x system 125 represents a new class of optical systems that enable microscope-like resolution with wide fields-of-view supporting modern high resolution sensors up to 57 mm diameter. The variable system is fully modular and ideally suited for submicron-imaging in inspection and measurement applications.

The mag.x system 125 is the first off-the-shelf microscope system that is specifically designed to be used with large sensors with a chip diagonal of up to 56 mm. The system is fully modular and can be adapted to many applications that require high resolution with large field-of-view.

Among many others, some of these applications include:

    • Flat-panel display (FPD) inspection
    • Semiconductor inspection and processing
    • MEMS & Nanotechnology
    • Printed circuit board (PCB) inspection
    • University and laboratory research
    • Technical microscopy
    • Materials science
    • Micro measurement & metrology