Image Analysis Test Targets



Image Analysis Test Targets are used to evaluate or calibrate an image system’s performance by measuring image quality standards such as resolution, contrast, or depth of field. Image Analysis Test Targets detail a range of shapes or patterns that measure the accuracy of an imaging system by viewing them with an imaging lens. Image Analysis Test Targets effectively determine the capabilities of an imaging system, allowing for accurate certification of performance as well as for establishing baseline standards for multiple systems working together.

  • Designed for Measurement Calibration; Ideal for Microscopes and Machine Vision Systems
  • Includes Ronchi Rulings, Concentric Circles, Square Grids, and a Linear Microscale
  • Two Targets Available for Different Magnifications
  • NIST Certificate of Accuracy Included
The Micro Line and Dot Standard is designed to calibrate imaging devices performing critical measurements. The pattern features known dot and line sizes of 2μm, 3μm, 4μm, 5μm, 6μm, 7μm, 8μm, 9μm, 10μm, 25μm, 50μm, 75μm, 100μm.

Image Analysis Micrometer

 Table lists the individual characteristics of the eight test plates featured. Also features a 2.5″ linear scale for larger scale calibrations or measurements, labeled every 0.5″. Each plate is accurate to within ±2 micron of the stated dimension. Glass slide dimensions: 1″ W x 3″ L x 1.5mm T. Large circle at the right of the slide is 0.5″ dia. Test Plates 1-4 correspond to top patterns and 5-8 to bottom patterns, all left to right. Patterns 1, 2 and 8 are calibrated on NIST certified version of micrometers.


Experimental Grade Reticles are optical windows on which have been engraved, etched, or printed various lines, numbers, etc. Once used in various binoculars and range finding instruments, they can be used as optical windows, collimators, or targeting systems.

Dot and Square Calibration Target

This target provides a highly accurate reference for feature sizes of circles and squares and is ideal for testing the accuracy of non-contact metrology systems, especially those vulnerable to distortion and blooming. The precision pattern is formed in Low Reflection Chromium on a stable Float Glass substrate in standard microscope slide format. 

Our Linear Scale Stage Micrometer is designed to accurately calibrate machine vision systems simultaneously in the X- and Y- axes. This allows calibration without rotation, and without compensation for camera aspect ratios. Micrometer features two scales – a metric scale featuring 25μm divisions, and an English scale featuring 1 mil (0.001″) divisions. Target is chrome on glass or chrome on opal




Micro Line and Dot Standard Stage Micrometer

Image Analysis Micrometer

Experimental Grade Reticles

Dot and Square Calibration Target

Dual Axis Linear Scale Stage Micrometer

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