Resolution Test Targets



Resolution Test Targets are used to measure the accuracy or performance of an imaging system for applications such as microscopy or imaging. Resolution Test Targets are inserted into an imaging system to provide measurement capabilities. Resolution Test Targets use a variety of patterns including Ronchi or star to measure a system’s resolution. High precision models are also available for demanding or precise measurement requirements.

Star targets

Star targets are ideal for identifying focus errors, astigmatism, and other aberrations existing in an imaging system. We have several targets to choose from

Sinusoidal patterns are designed specifically for evaluating the MTF of imaging lenses and other system components. This is accomplished by analyzing the ability of imaging components to reproduce the contrast of the sinusoidal target. MTF analysis is necessary when evaluating components to confirm that they meet design specifications and performance expectations.

Variable frequency targets are excellent for evaluating resolution, field distortion, and parfocal stability.


The USAF pattern wheel is an ideal target to measure resolution at different field points within an imaging system’s field of view. The pattern is available on three different substrate sizes: 1” square, 1.5” diameter, or a 1” x 3” slide. Each size includes 8 USAF patterns in a circular pattern plus one pattern in the center.

Resolving Power Chart

USAF pattern is printed in black, red, yellow, and blue to test for chromatic aberration and at 90° for testing astigmatism.

The IEEE target has been designed as a method of characterizing the amount of fine detail (resolution) that a camera system is able to reproduce from an original image. Since resolution can be different throughout the field of view both horizontal and vertical resolution can be measured in the center of the target as well as in all four corners.

Star Target

Sinusoidal Targets

Variable Frequency Targets

USAF Pattern Wheel Target

Resolving Power Chart

IEEE Target

For more information contact us