Join us to Edmund Webinar – Comparing the Performance of Lens Geometries January 26, 2023

Join us for a 30-minute webinar on January 26, 2023 11:00 AM – 11:30 AM ET

Presented by Edmund Optics’ experts Ian Schwartz and Oliva Fehlberg to learn how lens geometry affects the optical performance of your application.

Manufacturing tolerances can contribute to performance degradation, but optical aberrations affect nominal performance even for perfectly manufactured lenses. Since aberrations can dramatically affect spot size and image quality, deciding which lens is best for your application is not always straightforward.

At the conclusion of the webinar, participants will have a strong understanding of:

  • The key impacts of geometry on application-specific optical performance

  • The terminologies and testing parameters for optical lenses

  • Choosing the right lenses for your application requirement

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SPIE Photonics West , San Francisco, California, USA January 28 – February 2 , 2023

SPIE Photonics West January 28 – February 2 , 2023 

The world’s premier lasers, biomedical optics and biophotonic technologies, quantum, and optoelectronics event. Make plans to join the world’s largest photonics technologies event. Come to discuss research in biomedical optics, biophotonics, industrial lasers, optoelectronics, microfabrication, MOEMS-MEMS, displays, quantum technologies, including quantum 2.0, and other similar topics with a focused, engaged audience. Discuss your product requirements with top optics and photonics suppliers at either of the two exhibitions, and participate in the strong industry program for learning about the innovation happening in our industry. Register now and make plans to attend.

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Infrared Lock-in Thermography for Inspection of Electronics & Integrated Circuits February 9, 2023

InfraTec Online Event: Infrared Lock-in Thermography for Inspection of Electronics & Integrated Circuits 

February 9, 2023 10:00 AM – 12:00 AM (CET)

A Glimpse at the Online Event – Failure analysis and defect inspection – Quality and process control – Flexible R&D solution – Basic configuration to turnkey solution – Hotspot detection on printed circuit boards, integrated circuits, semiconductor material and multi-chip modules – Detection of faulty thermal connections of heat sinks, short circuits, soldering defects and wire bonding errors Technical Lecture from Thermography Practice “Challenges and Applications of Thermography in Microelectronics” Speaker: Marko Hoffmann, Infineon Technologies Dresden GmbH & Co. KG


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